In my previous posts, I mentioned the need to capture the boundaries between the recrystallized and deformed grains. Partitioning by the OIM Data Analysis software by TSL/EDAX is limiting because the only boundaries that are exported are those between the recrystallized grains. Therefore there is a significantly loss of information on all the edges bordering the deformed regions. This cause the Sigma3 content in this region to become extremely saturated due to the exclusion of the high angle boundaries with the deformed regions, as well as limit the ability to analyze misorientations at the border between deformed and recrystallized grains.
I've written a simple C++ code in the past that basically picks the reconstructed boundaries of interest simply based on GrainIDs. This was easy to achieve in the EBSD scan I was working with since I was just looking at boundaries around two abnormal grains (see the picture below). The program went through and selected all reconstructed boundaries that contained one of the abnormal grains.
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